Showing results: 196 - 200 of 200 items found.
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SPEA S.p.A.
Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
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JFT -
JTAG Technologies Inc.
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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V93000 SoC / Smart Scale -
Advantest Corp.
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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ARC Technology Solutions
In today’s fast paced manufacturing environment, where time to market and cost competitiveness is key, having a manufacturing partner like ARC can be a valuable resource for your company. ARC has a build-to-print manufacturing capability with our unique ‘engineer-to-print’ philosophy to make sure precision manufacturing and final build accuracy is top priority for your module level or system level builds. ARC can support up to several hundred module level assemblies (CCA subassemblies, cabling, mechanical and paneling elements) with abilities to perform a variety of software, embedded tasks and functional testing including a mixed signal test capability using our in-house MSAT (Mixed Signal Automated Tester) platform. We have a thorough process created through the development of our own products and test solutions. We know the importance of having a regimented manufacturing process, augmented with engineering expertise to address challenges that come up with building complex, high-mix, medium volume products.
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Keysight Technologies
GoldenGate RFIC Simulation and Analysis Software is an advanced simulation and analysis solution for integrated mixed signal RFIC designs that is fully integrated into the Cadence Analog Design Environment (ADE). GoldenGate is part of Keysight's RFIC simulation, analysis and verification solution that also includes Momentum for 3-D planar electromagnetic simulation, SystemVue & Ptolemy wireless test benches for system-level verification, and the Advanced Design System (ADS) Data Display for advanced data analysis. This suite links the RF system, subsystem, and component-level design and analysis as part of a unique and comprehensive RFIC design flow.
